September 3rd, 2010

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    


 

Randal Mulder, Freescale Semiconductors

Live, online, Wednesday November 12th

1pm U.S. California
 (check time in your area)

  
Atomic Force Probe Analysis of Non-Visible Defects in Sub-100nm
CMOS Technologies

In this online presentation, Mr. Mulder will demonstrate how Atomic Force Probing was used to characterize failing sub-100nm transistors, identify possible failure mechanisms and, allow device/process engineers to make adjustments to the wafer fabrication process to correct the problem, even though physical analysis with SEM/TEM was not able to image and identify a failure mechanism.		 

chinese translation
             Can’t make it to the Live, Online, Seminar? Check back later for an archived recording.