May 25th, 2013

Fault Isolation and Nanoprobing Capabilities Within a Single Tool     Multiprobe nanoprober chinese site link    Multiprobe nanoprober Japanese Link    

Trade Show Schedule

multiprobe-failure-analysis-booth
You have no doubt heard about the award-winning innovations that have made the MultiProbe Atomic Force Prober (AFP) the standard in failure analysis for the semiconductor industry. So, put MultiProbe at the top of the list of booths you want to visit. Your view of FA will change forever.

 

IRPS
April 14th – 18th, 2013

Hyatt Regency Monterey Resort & Spa
Monterey, CA, USA

 

IPFA
July 15th – 19th, 2013

Shangri-La Hotel
Suzhou - China

 

MultiProbe at ESREF ESREF
September 30th - October 4th 2013

Palais des Congrès of Arcachon
Arcachon - France

 

MultiProbe at ISTFA ISTFA
November 3rd – 7th, 2013

San Jose Convention Center
San Jose, CA



 

LSI Testing Symposium
November 13 – 15, 2013

Senri Life Science Center
Toyonaka, Osaka - Japan